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38
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DATE
2008
IEEE
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DATE 2008
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Guiding Circuit Level Fault-Tolerance Design with Statistical Methods
14 years 5 months ago
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www.arctic.umn.edu
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
Drew C. Ness, David J. Lilja
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