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GLVLSI
2003
IEEE
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14 years 6 months ago
A highly regular multi-phase reseeding technique for scan-based BIST
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
Emmanouil Kalligeros, Xrysovalantis Kavousianos, D...