A highly regular multi-phase reseeding technique for scan-based BIST

In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan chain in different test phases. The LFSR generates the same state sequence in all phases, keeping that way the implementation cost low. Also, a dynamic reseeding scheme is adopted for further reducing the required hardware overhead. A seed-selection algorithm is moreover presented that, taking advantage of the multi-phase architecture, manages to reduce the number of the required seeds for achieving complete (100 %) fault coverage. Experimental results demonstrate the superiority of the proposed LFSR reseeding approach over the already known reseeding techniques. Categories and Subject Descriptors B.8.1 [Performance and Reliability]: Reliability, Testing, and Fault-Tolerance. General Terms Algorithms, Design, Reliability, Experimentation. Keywords Built-In Self-Test, Scan-based schemes, Linear Feedback Shift R...

• Type: Conference
• Year: 2003
• Where: GLVLSI
• Authors: Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos
• Keywords: GLVLSI 2003, LFSR, LFSR Reseeding Approach, Scan-based Bist, VLSI