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ICCD
2004
IEEE
109views Hardware» more  ICCD 2004»
14 years 9 months ago
Low Power Test Data Compression Based on LFSR Reseeding
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
Jinkyu Lee, Nur A. Touba