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DATE
2007
IEEE
100views Hardware» more  DATE 2007»
14 years 5 months ago
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon W...