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    DDECS
    2007
    IEEE
    93views Hardware» more  DDECS 2007»
    Manifestation of Precharge Faults in High Speed DRAM Devices
    14 years 6 months ago
    Manifestation of Precharge Faults in High Speed DRAM Devices
    Download  ce.et.tudelft.nl
    Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
    Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
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