DAGSTUHL
2006
14 years 1 months ago
2006
Long-term reliability of processors in embedded systems is experiencing growing attention since decreasing feature sizes and increasing power consumption have a negative influence...
DAC
1996
ACM
14 years 4 months ago
1996
ACM
Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...