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    STOC
    2003
    ACM
    65views Algorithms» more  STOC 2003»
    Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
    14 years 12 months ago
    Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
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    Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi ...
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