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STOC
2003
ACM

Randomness-efficient low degree tests and short PCPs via epsilon-biased sets

14 years 12 months ago
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi
Added 03 Dec 2009
Updated 03 Dec 2009
Type Conference
Year 2003
Where STOC
Authors Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson
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