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Algorithms
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STOC 2003
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Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
14 years 8 months ago
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Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi
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Low Degree Tests
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STOC 2003
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Added
03 Dec 2009
Updated
03 Dec 2009
Type
Conference
Year
2003
Where
STOC
Authors
Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson
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Algorithms Study Group
Computer Vision