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NMA
2010
13 years 9 months ago
Modeling of the SET and RESET Process in Bipolar Resistive Oxide-Based Memory Using Monte Carlo Simulations
A stochastic model of the resistive switching mechanism in bipolar oxide-based resistive random access memory (RRAM) is presented. The distribution of electron occupation probabili...
Alexander Makarov, Viktor Sverdlov, Siegfried Selb...