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ICCD
2002
IEEE
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14 years 8 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...