Sciweavers

DATE
2000
IEEE
136views Hardware» more  DATE 2000»
14 years 4 months ago
Parametric Fault Simulation and Test Vector Generation
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
Khaled Saab, Naim Ben Hamida, Bozena Kaminska