Sciweavers

33
Voted
DATE
2010
IEEE
145views Hardware» more  DATE 2010»
14 years 5 months ago
An evaluation of a slice fault aware tool chain
Abstract—As FPGA sizes and densities grow, their manufacturing yields decrease. This work looks toward reclaiming some of this lost yield. Several previous works have suggested f...
Adwait Gupte, Phillip Jones