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    ISPD
    2000
    ACM
    139views Hardware» more  ISPD 2000»
    Critical area computation for missing material defects in VLSI circuits
    13 years 11 months ago
    Critical area computation for missing material defects in VLSI circuits
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    We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
    Evanthia Papadopoulou
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