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    ISPD
    2000
    ACM
    139views Hardware» more  ISPD 2000»
    Critical area computation for missing material defects in VLSI circuits
    14 years 4 months ago
    Critical area computation for missing material defects in VLSI circuits
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    We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
    Evanthia Papadopoulou
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