PACS
2000
Springer
14 years 6 months ago
2000
Springer
Because the inductive noise Ldi/dt is induced by the power change and can have disastrous impact on the timing and reliability of the system, high-performance CPU designs are more ...
GLVLSI
2010
IEEE
14 years 8 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...