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31
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DATE
2010
IEEE
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DATE 2010
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IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults
14 years 5 months ago
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—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
Songjun Pan, Yu Hu, Xiaowei Li
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