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DATE
2010
IEEE
160views Hardware» more  DATE 2010»
14 years 5 months ago
IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
Songjun Pan, Yu Hu, Xiaowei Li