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    ISAAC
    2007
    Springer
    131views Algorithms» more  ISAAC 2007»
    On the Fault Testing for Reversible Circuits
    14 years 5 months ago
    On the Fault Testing for Reversible Circuits
    Download  www.lab.ss.titech.ac.jp
    This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
    Satoshi Tayu, Shigeru Ito, Shuichi Ueno
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