On the Fault Testing for Reversible Circuits

14 years 28 days ago

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This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the size of a minimum complete test set.

Satoshi Tayu, Shigeru Ito, Shuichi Ueno

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ISAAC 2007 | Minimum Complete Test | Non-trivial Lower Bounds | Test Set |

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Added	08 Jun 2010
Updated	08 Jun 2010
Type	Conference
Year	2007
Where	ISAAC
Authors	Satoshi Tayu, Shigeru Ito, Shuichi Ueno

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On the Fault Testing for Reversible Circuits

ISAAC 2007 | Minimum Complete Test | Non-trivial Lower Bounds | Test Set |

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