MR 2007 | Sciweavers

34

click to vote

MR
2007

127views Robotics» more MR 2007»

A comprehensive model for PMOS NBTI degradation: Recent progress

13 years 12 months ago

Download cobweb.ecn.purdue.edu

Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...

claim paper

Read More »

32

click to vote

MR
2007

83views Robotics» more MR 2007»

Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits

13 years 12 months ago

Download www.ics.ee.nctu.edu.tw

CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...

Shih-Hung Chen, Ming-Dou Ker

claim paper

Read More »

35

click to vote

MR
2007

144views Robotics» more MR 2007»

Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions

13 years 12 months ago

Download hal.archives-ouvertes.fr

Two extreme configurations under short circuit conditions leading to the punch through Trench IGBT failure under the effect of the temperature and the gate resistance have been st...

A. Benmansour, Stephane Azzopardi, J. C. Martin, E...

claim paper

Read More »

25

click to vote

MR
2007

93views Robotics» more MR 2007»

Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly

13 years 12 months ago

Download www.imec.be

The development of a simplified analytical model to describe the thermal history of a Printed Circuit Board assembly (PCA) during convective reflow soldering is described in this ...

Nele Van Steenberge, Paresh Limaye, Geert Willems,...

claim paper

Read More »

Sciweavers

Explore & Download

Productivity Tools

Document Tools

Image Tools

Sciweavers