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ICCAD
2010
IEEE
133views Hardware» more  ICCAD 2010»
13 years 9 months ago
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...