Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
Sci2ools
International Keyboard
Graphical Social Symbols
CSS3 Style Generator
OCR
Web Page to Image
Web Page to PDF
Merge PDF
Split PDF
Latex Equation Editor
Extract Images from PDF
Convert JPEG to PS
Convert Latex to Word
Convert Word to PDF
Image Converter
PDF Converter
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
41
click to vote
ICCAD
2010
IEEE
133
views
Hardware
»
more
ICCAD 2010
»
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
13 years 9 months ago
Download
tiger.ee.nctu.edu.tw
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...
claim paper
Read More »