MTDT
2000
IEEE
13 years 11 months ago
2000
IEEE
MTDT
2000
IEEE
13 years 11 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
MTDT
2000
IEEE
13 years 11 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...