Using GLFSRs for Pseudo-Random Memory BIST

In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Recently, it was shown that using GLFSRs as pattern generators for pseudo-random logic tests can increase the fault coverage noticeably in comparison to standard pseudo-random test pattern generators. Since memory faults differ from logic faults, we examined if that is also the case for pseudo-random memory tests. We found that GLFSRs can increase the fault coverage of pseudo-random tests for several fault types, especially for complex faults as stuck-open faults. Thus, the usage of GLFSRs as pattern generators for pseudo-random memory testing is recommended although some area overhead has to be accepted.

• Type: Conference
• Year: 2000
• Where: MTDT
• Authors: Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer
• Keywords: Hardware, MTDT 2000, Pseudo-random, Pseudo-random Memory, Pseudo-random Tests