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TCAD
2002
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TCAD 2002
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Area fill synthesis for uniform layout density
13 years 11 months ago
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www.cs.virginia.edu
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
Yu Chen, Andrew B. Kahng, Gabriel Robins, Alexande...
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