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33
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ISQED
2010
IEEE
121
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ISQED 2010
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A novel two-dimensional scan-control scheme for test-cost reduction
14 years 3 months ago
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ic.ncue.edu.tw
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
Chia-Yi Lin, Hung-Ming Chen
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