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17
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ISCAS
2007
IEEE
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ISCAS 2007
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A Circuit-Based Noise Parameter Extraction Technique for MOSFETs
14 years 5 months ago
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www-tcad.stanford.edu
Experimental verification of noise models is one of the major challenges in noise modeling. A circuit-based noise characterization technique is introduced which uses phase noise me...
Reza Navid, Thomas H. Lee, Robert W. Dutton
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