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26
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ICCAD
2009
IEEE
101
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ICCAD 2009
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Compacting test vector sets via strategic use of implications
13 years 8 months ago
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As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan...
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