Sciweavers

    ITC
    1996
    IEEE
    83views Hardware» more  ITC 1996»
    Test Generation for Global Delay Faults
    14 years 4 months ago
    Test Generation for Global Delay Faults
    Download  faculty.cs.tamu.edu
    This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the numbe...
    G. M. Luong, D. M. H. Walker
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.