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VLSID
2008
IEEE
153views VLSI» more  VLSID 2008»
15 years 14 days ago
Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
Yuanlin Lu, Vishwani D. Agrawal