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ASPDAC
2007
ACM
133views Hardware» more  ASPDAC 2007»
14 years 4 months ago
Modeling Sub-90nm On-Chip Variation Using Monte Carlo Method for DFM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvi...