Sciweavers

DFT
2005
IEEE
81views VLSI» more  DFT 2005»
14 years 5 months ago
Noise Analysis of Fault Tolerant Active Pixel Sensors
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
Cory Jung, Mohammad Hadi Izadi, Michelle L. La Hay...