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38
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ICCD
2004
IEEE
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ICCD 2004
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A General Post-Processing Approach to Leakage Current Reduction in SRAM-Based FPGAs
14 years 8 months ago
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iccd.et.tudelft.nl
A negative effect of ever-shrinking supply and threshold voltages is the larger percentage of total power consumption that comes from leakage current. Several techniques have been...
John Lach, Jason Brandon, Kevin Skadron
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