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46
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VLSID
2002
IEEE
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VLSI
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VLSID 2002
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Evaluating Run-Time Techniques for Leakage Power Reduction
14 years 12 months ago
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www.cse.psu.edu
While some leakage power reduction techniques require modification of process technology achieving savings at the fabrication stage, others are based on circuit-level optimization...
David Duarte, Yuh-Fang Tsai, Narayanan Vijaykrishn...
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