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    DATE
    2006
    IEEE
    85views Hardware» more  DATE 2006»
    Test set enrichment using a probabilistic fault model and the theory of output deviations
    14 years 5 months ago
    Test set enrichment using a probabilistic fault model and the theory of output deviations
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    — We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
    Zhanglei Wang, Krishnendu Chakrabarty, Michael G&o...
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