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    GLVLSI
    2010
    IEEE
    156views VLSI» more  GLVLSI 2010»
    A multi-level approach to reduce the impact of NBTI on processor functional units
    14 years 8 months ago
    A multi-level approach to reduce the impact of NBTI on processor functional units
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    NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
    Taniya Siddiqua, Sudhanva Gurumurthi
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