DSN
2004
IEEE
13 years 11 months ago
2004
IEEE
The relentless scaling of CMOS technology has provided a steady increase in processor performance for the past three decades. However, increased power densities (hence temperature...
ISPASS
2008
IEEE
14 years 1 months ago
2008
IEEE
Abstract— This work concerns metrics for evaluating microarchitectural enhancements to improve processor lifetime reliability. A commonly reported reliability metric is mean time...