The Impact of Technology Scaling on Lifetime Reliability

The relentless scaling of CMOS technology has provided a steady increase in processor performance for the past three decades. However, increased power densities (hence temperatures) and other scaling effects have an adverse impact on long-term processor lifetime reliability. This paper represents a first attempt at quantifying the impact of scaling on lifetime reliability due to intrinsic hard errors, taking workload characteristics into consideration. For our quantitative evaluation, we use RAMP [15], a previously proposed industrial-strength model that provides reliability estimates for a workload, but for a given technology. We extend RAMP by adding scaling specific parameters to enable workload-dependent lifetime reliability evaluation at different technologies. We show that (1) scaling has a significant impact on processor hard failure rates

• Type: Conference
• Year: 2004
• Where: DSN
• Authors: Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers
• Keywords: Computer Networks, DSN 2004, Lifetime Reliability, Lifetime Reliability Evaluation, Processor Lifetime Reliability