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ITC
2003
IEEE
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ITC 2003
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Case Study - Using STIL as Test Pattern Language
14 years 5 months ago
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www.itcprogramdev.org
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
Daniel Fan, Steve Roehling, Rusty Carruth
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