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39
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VTS
1996
IEEE
74
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VTS 1996
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An unexpected factor in testing for CMOS opens: the die surface
14 years 3 months ago
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www.soe.ucsc.edu
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
Haluk Konuk, F. Joel Ferguson
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