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ET
2007
119views more  ET 2007»
13 years 11 months ago
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
DDECS
2007
IEEE
121views Hardware» more  DDECS 2007»
14 years 5 months ago
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
Luigi Dilillo, Bashir M. Al-Hashimi