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32
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ICCAD
2007
IEEE
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ICCAD 2007
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Enhancing design robustness with reliability-aware resynthesis and logic simulation
14 years 9 months ago
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www.eecs.umich.edu
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
Smita Krishnaswamy, Stephen Plaza, Igor L. Markov,...
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