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157
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GLVLSI
2008
IEEE
204
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VLSI
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GLVLSI 2008
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NBTI resilient circuits using adaptive body biasing
16 years 12 hour ago
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people.virginia.edu
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
Zhenyu Qi, Mircea R. Stan
claim paper
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