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VLSID
2004
IEEE
117views VLSI» more  VLSID 2004»
15 years 29 days ago
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
Gethin Norman, David Parker, Marta Z. Kwiatkowska,...