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ICCD
2005
IEEE
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14 years 8 months ago
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty