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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 6 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen