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46
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ISQED
2010
IEEE
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ISQED 2010
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Limits of bias based assist methods in nano-scale 6T SRAM
13 years 10 months ago
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Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Bent...
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