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    DAC
    2008
    ACM
    152views Computer Architecture» more  DAC 2008»
    Scan chain clustering for test power reduction
    15 years 17 days ago
    Scan chain clustering for test power reduction
    Download  www.ra.informatik.uni-stuttgart.de
    An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
    Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
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