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ITC
2002
IEEE
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ITC 2002
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Scan Power Reduction Through Test Data Transition Frequency Analysis
14 years 1 months ago
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cseweb.ucsd.edu
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
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