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ATS
2004
IEEE
108views Hardware» more  ATS 2004»
14 years 3 months ago
Rapid and Energy-Efficient Testing for Embedded Cores
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...