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26
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ATS
2004
IEEE
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ATS 2004
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Rapid and Energy-Efficient Testing for Embedded Cores
14 years 2 months ago
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test.ict.ac.cn
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
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