Sciweavers

ATS
2004
IEEE
108views Hardware» more  ATS 2004»
14 years 2 months ago
Rapid and Energy-Efficient Testing for Embedded Cores
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...