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DFT
2003
IEEE
86views VLSI» more  DFT 2003»
14 years 22 days ago
CROWNE: Current Ratio Outliers with Neighbor Estimator
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...
Sagar S. Sabade, D. M. H. Walker