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    DAC
    2006
    ACM
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    A family of cells to reduce the soft-error-rate in ternary-CAM
    15 years 15 days ago
    A family of cells to reduce the soft-error-rate in ternary-CAM
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    Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
    Navid Azizi, Farid N. Najm
    claim paper
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